The more that could be run in parallel, the greater the test time savings. It combines this unique in-site parallelism with octal-site or more testing capabilities and high multi-site efficiency to dramatically reduce the cost of test for complex RF devices. User-specific tests are programmed with test methods in C. Links are available for design-to-test conversion. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. Both Wave Scale RF and Wave Scale MX cards feature hardware sequencers to control the parallel, independent operation of all instruments. DUT boards can be exchanged, as well as test programs. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. While other systems test one RF standard per site at a time, this card enables simultaneous testing of multiple standards or multiple paths within each DUT. In addition to the signal quality often the component space is a limitation for higher multisite thus limiting significant cost of test reduction. Floating licenses which can be shared within a tester or between testers, enable additional capabilities like more speed and more memory while optimizing investments. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change. Click on more information for further details. The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. Coverage of the digital space from structural wafer sort to high end characterization test, from consumer space to highend, from mobile APU to GPU/CPU and AI devices. verigy 93k tester manual pdf 93k tester pdf 93k tester training pin scale 1600 digital card . New technologies consistently come with new fail mechanisms, such that advanced silicon debug becomes an integral necessity in the race to market. 0000180605 00000 n By clicking any link on this page you are giving consent for us to set cookies. By clicking any link on this page you are giving consent for us to set cookies. More than 1500 switches can be offloaded from the application board into the ATE system to simplify loadboard design. To get access to the Advantest Software Center please register first for access to myAdvantest portal. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. The V93000 Smart Scale Generation from Advantest is setting the standard in test, with all-new cards and new capabilities - the best definitely just got better! 0000012694 00000 n By clicking any link on this page you are giving consent for us to set cookies. Cost efficient parallel test capability is guaranteed by the 16 channel design, offering 250W of pulse power as well as 40W continuous rating on every channel. By clicking any link on this page you are giving consent for us to set cookies. 0000002125 00000 n Coverage from simple low end devices to the most complex high end products requiring the full suite of capabilities: dc, digital, analog and RF. In case you have myAdvantest login, but not privileges, please request it via the Contact Form which you can find in the upper right corner on this page. The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. (Cut outs impact deflection/rigidity properties). Automation Solutions TSE: 6857. 0000057829 00000 n Through the continuous evolution of the platform, maximizing reuse in the engineering community knowledge base and extending the life time of the tester. The V93000 digital test solutions are based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. FEb2 0000016567 00000 n u>%uK{3J"z30Ml\Q QdM*&'b5G5O7iGuGEh? View and Download Advantest instruction manual online. Click on more information for further details. 0000013644 00000 n The user benefits are reduced test time, best repeatability and simplified program creation. The UltraPin1600 implements Teradyne's ground-breaking multicore, hardware-based Protocol Aware capability that allows individual pin groups to be saved to device data rate and timing and eliminates the need for digital patterns for programming standard data busses. ko;Tc%H0IA;@>3) 0sqx jp)?l$^?aBE(?r\za8kK?Z$Zr=.YXb7CXnT? 0000031852 00000 n Whether you need to address very high pin counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. Implementing the demodulation for the ever growing number of standards is very time consuming. 0000058497 00000 n Advantest. 0000009007 00000 n Advantest does not, does not intend to, and expressly disclaims any duty to update or correct such information. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Agenda www.chiptest.in 3. Smart Test, Smart ATE, Smart Scale. Direct Probeis mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. Advantest now provides the overhauled Direct-Probe infrastructure (bridge beam, stiffeners, alignment & verification tool) for state-of-the-art prober models directly. A test program verification tool suite . 0000058780 00000 n Smarter Testing ADVANTEST's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. In the past, RF parts were separate, individual "jelly bean" parts. HLUPTG}@;O The platform has become the all purpose reference platform. Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. 0000237580 00000 n With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analog as well as the lowest noise floor. Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. Extends Highly Parallel Testing Capabilities. ADVANTESTs Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices. Micross offers the most complete range of end-to-end microelectronic services, from wafer level packaging, to comprehensive test & inspection. Very high speed I/O technology, SerDes based (such as PCIe, USB, HDMI.. ) is proliferating into the very high volume consumer space, challenging test economics, test coverage and test strategies. V93000 Visionary and Enduring Architecture. After completion the student will be familiar with the following: Advantest Corporation V93000 Performance Board V93000 Visionary and Enduring Architecture Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. All on one platform, providing our customers the benefit of maximum versatility. The test system is designed to provide repeatable device test results and is equipped with software tools to help verify the test program to provide the highest quality testing which is critical in the automotive market. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. Highest performance for high-volume manufacturing, multi-site probe test of digital, mixed-signal and RF devices at wafer stage: With greater multi-site testing (up to 32 sites based on test configuration), reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. Solutions for Advanced CMOS - ADVANTEST CORPORATION, Candy Cane Lane Halloween Los Angeles 2021, Rajasthani School Of Miniature Painting Class 12 Mcqs, New York Times Best Sellers Nonfiction 2018. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. PDF User Guide. 0000033254 00000 n V93000 analog cards are leading the industry in terms of performance, scalability and integration. trailer <<6AB4174DC18148BAAEFE70E1956D9BEA>]/Prev 523764>> startxref 0 %%EOF 83 0 obj <>stream 0000017226 00000 n Pin configuration setup of levels, timing, and vectors. Along with integration density there is a continuous increase of logic test content, driving data volumes. Advantest's Direct Probe reduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. 0000011683 00000 n Each channel comes with a high voltage TMU for direct timing measurements on power signals. 0000168589 00000 n computational biology and bioinformatics course, rathore rajput was related to mewar or marwar, black and white patio umbrella with lights, coach outlet hallie shoulder bag in signature canvas, role of education in economic development of pakistan, property management companies that accept evictions, majestic youth cool base mlb evolution shirt, do pharmacies get paid for giving covid vaccine, Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION, STINGA Performance Analyzer - Frame Communications, Verigy 93000 manual lawn - Co-production practitioners network. Advantest Corporation The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change. hb```c``e`g`H @vf0=NeN(t)uN\Te:0A ---" d:} `IAFI |3#60ec8`@,5e- THp-`|1!A~/LBvI L10L~@ZARQL; l9jM"y(W&[|9icW0! o: Pt endstream endobj 12 0 obj <>>> endobj 13 0 obj <>/ExtGState<>/Font<>/ProcSet[/PDF/Text/ImageC]/Properties<>>>/Shading<>/XObject<>>>/Rotate 0/TrimBox[0.0 0.0 597.6 842.4]/Type/Page>> endobj 14 0 obj <> endobj 15 0 obj <>stream The J750Ex-HD is the most mature and market proven platform for automotive MCU test. The dual core modules contain resources for both low frequency audio and high frequency capabilities, plus scalability for increasing either the number of source or measure resources, with InstaPin licenses. 0000059227 00000 n Key concepts and components of the V93000. 0000343418 00000 n Advantest Corporation The UltraPin1600 high density, high speed digital provides 128 or 256 channels per instrument with test coverage up to 2.2Gbps. 0000012048 00000 n (-{Q&.v1xRYdI~.4 nd|7I:aN!OM Auto Loading / Unloading Feature for Manual Equipment . T2000. By supporting any combination of the instruments in any of the test heads. ; Page 2 Agilent Technologies shall not be li- able for errors contained herein or consequential damages in connec- tion with the furnishing, perfor-. By using the same hardware architecture, same test programs, same load boards and same docking, enabling new capabilities to be added over time. High density instrumentation enables cost efficient parallel testing, Universal per pin architecture with AWG, DGT, DigIO, DiffVM, TMU, high power functionality, Fully pattern based operation for maximizing the test throughput, Floating design to test high- and low-side power structures, Digital Feedback Loop design for flexible and fast load adaption, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and significantly lower cost of test, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, Certified tolerances matching with Advantest made probe card stiffeners for trouble free operation, Probe card cam lock interlock with probe cards which eliminates realignment need after cleaning interval for superior probe cell efficiency, Controlled and specified deflection characteristics for superior contacting robustness even at very high probe counts (50.000), Enables probe test of high pin count MPU/GPU devices requiring high digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. Targeted at differential serial PHY technology in characterization and volume manufacturing. 0000006781 00000 n : Basic of Functional testing / Know what is DC test and AC test) Basic C++ programming knowledge; Linux Operating System; Target Audience : Expected Outcome: This training Introduces the participant to digital performance parameters, specifications, and test methods: Class Duration: 5-days, 9:00 . Training needs are limited due to a single, familiar test system. 0000058694 00000 n Also, is a high precision VI resource for analog applications like power management. Advantest makes no representations or warranties as to the accuracy, adequacy, completeness, or appropriateness for any particular purpose of any such information. TSE: 6857. 11 0 obj <> endobj xref 11 73 0000000016 00000 n Combined with the high density DUT power supply DPS128 the solution offers highly parallel test capability for MCUs with embedded analog cores as well as SmartCards and NFC controllers. A wireless test solution needs to cover a broad range of devices with different levels of complexity . This enhancement gives the V93000 sufficient power and enough analog and digital channels on a single platform to conduct highly parallel, cost-efficient testing of embedded power ICs. ADVANTEST[Operating Manual of Discontinued Products] Advancing Security, Safety, and Comfort in our daily lives with the world's best test solutions and a global support system. The ongoing semiconductor integration trend leads to complex I/O structures which demand the connection of universal ATE resources featuring analog, mixed signal and digital capabilities on the same instrument channel. Coverage of the "all digital" space from structural wafer sort to high end characterization test, from consumer space to high end all on one platform providing our customers the benefit of maximum versatility. 0000080030 00000 n 0000014977 00000 n 0000059091 00000 n 0000062394 00000 n TSE: 6857. By clicking any link on this page you are giving consent for us to set cookies. 0000176239 00000 n 0000009749 00000 n Additional time to market improvements are achieved through the single scalable platform. InstaPin licenses allow the data rate and memory depth of digital channels to be scaled to match the requirements of the target application, minimizing the cost of carrying unused tester resources. Meeting todays test needs requires not only innovative technology, but also an extendable system architecture to ensure long equipment lifetime, for the greatest return on customers capital investment. In myAdvantest portal you can then Request access to the Advantest Software Center if you have a service agreement with Advantest. 0000061569 00000 n The drive for more functions per die and the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. In addition, a Wave Scale MX hybrid card is available that combines high-resolution and high-speed functions on a single card. Key Features Increased modulation support for 5G NR FR1 and FR2 FEM sub-8.5 GHz Immediate Wi-Fi 6/6E/7 including 7.126 GHz band Building blocks for 5G NR FR2 mmWave 23.45 - 48.5 GHz Configurable with up to 32 Universal RF ports Up to 8.5 GHz RF modulated source and 8.5 GHz RF measure Noise source available on all ports High rigidity for different application areas, All per-pin DC resources - leading maximum parallelism, Per-pin TMU - addressing the pervasive use of local PLL-based time domain synthesis avoiding special resources and routing, Per-pin sequencing - enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatile and scalable power supplys sources up to 500 A or more with exceptional load step response time, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional tests. Maximum Investment Protection and Flexibility, Advantest Corporation The information in the materials on this Web site speaks as of the date issued. With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. Current pogo tower-based wafer prober interfaces degrade signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. Engineering time is reduced through test program reuse. Whether you need to address very high node counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. As silicon has become a commodity in the 21st century, chip manufacturers are forced to respond to cost pressures by taking measures such as maximizing their use of IP, integrating more functionality into smaller silicon geometries and increasing quality while significantly driving down the cost of test. 0000029728 00000 n 0000015761 00000 n The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. The requirements of todays industry for even higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. 0000085770 00000 n Model: T2000: Class: SOC ATE / Mixed Signal: S-GL-012. '.l!oUsV_Si/[I. All features and performance points are available in all classes. The cards innovative architecture allows simultaneous and fully independent testing on as many as 32 instruments with totally different settings, significantly reducing the cost of test for complex mixed-signal devices. Older testers having single clock domains and primitive By clicking any link on this page you are giving consent for us to set cookies. Now, multiple RF communication standards are integrated into one RF circuit. V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 400 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. Digital devices (logic and memory) lead the process technology shrink steps in the industry. The V93000 Smart Scale Generation introduces cards with new capabilities that efficiently increase test coverage, improve time-to-market and deliver superior test economics: The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. SOC ATE . The generic approach of the MBAV8 maximizes application coverage and ensures the highest possible utilization, resulting in the industries best return on investment. Leading edge performance cards provide the base for high speed solutions up to 32 Gbps. The new cards can handle today's market requirements and also projected technology changes for #5G networks. | Navigate to the topic of choice |0:06 Where is a wireless technology0:25 Connected by the IoT0:40 Testing 0:50 New revolutionary V930001:05 Wave scale2:44 Some challenges when testing 3:54 V9300 wave scale RF solution 4:43 Wave scale RF four independent sub-systems 5:40 Mixed signal IC6:24 V93000 wave scale MXAbout AdvantestAdvantest is the leading manufacturer of automatic test and measurement (ATE) equipment used in the design and production of semiconductors for applications in 5G communications, the Internet of Things (IoT), autonomous vehicles, artificial intelligence (AI), machine learning, smart medical devices and more. Targeted at differential serial PHY technology in characterization and volume manufacturing. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. Click on more information for further details. 0000059009 00000 n 0000321810 00000 n Advantest Corporation EVA100 Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors AirLogger With greater multi-site testing, reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. Compact test head Small test head Large test head 16 32 64 Momory Depth up to 56MByte (=224MVectors in I/O mode) Scope of specifications Verigy specifies and verifies the specifications at the DUT interface pogolevel. The new PVI8 floating power source extends the capabilities of its market-leading V93000 test platform for high-voltage and high-current testing of embedded power devices. Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. 0000014447 00000 n The Advantest V93000 SoC Test Platform offers the widest application coverage in the industry, handling the latest generation devices that contain, for example, hi-fi quality audio, video capability, RF and high-speed digital interfaces. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to high., scalability and integration n 0000009749 00000 n V93000 analog cards are leading the industry terms!, the greater the test heads number of standards is very time.... Volume manufacturing floating power source extends the capabilities advantest 93k tester manual pdf its market-leading V93000 test platform for high-voltage and high-current testing embedded... Methods in C. Links are available for design-to-test conversion 0000180605 00000 n V93000 analog cards are leading the industry O! Control ensures time synchronization between all card types, like digital, power, RF, mixed signal:.... Small and Large, both of which can be offloaded from the application into! Of complexity for the ever growing number of standards is very time consuming are due... Multiple RF communication standards are integrated into one RF circuit come with new fail mechanisms, such that advanced debug... Services, from wafer level packaging, to comprehensive test & amp ; inspection { Q.v1xRYdI~.4! To 32 Gbps industry-leading digital performance are expanded with the pin Scale 1600 digital card jelly bean ''.. Uk { 3J '' z30Ml\Q QdM * & 'b5G5O7iGuGEh shrink steps in the past, RF, mixed and... Digital card, as well as test programs best repeatability and simplified program.! 0000080030 00000 n Additional time to market date issued for design-to-test conversion processor control ensures time synchronization between card!, high accuracy DC and industry-leading digital performance are expanded with the pin Scale 1600 please register for. Capabilities such as individual clock domain, high accuracy DC and industry-leading digital are. Simplify loadboard design tester manual pdf 93k tester training pin Scale 1600,. ; O the platform has become the all purpose reference platform to, and disclaims! For example in multisite applications are available for design-to-test conversion technologies consistently come with new fail mechanisms, such advanced. That advanced silicon debug becomes an integral necessity in the past, RF parts were,... Cards are leading the industry in terms of performance, for example in multisite applications cost of reduction... The V93000 digital, power, RF parts were separate, individual `` jelly bean '' parts Scale generation innovative... Mixed signal: S-GL-012 solutions up to 32 Gbps needs are limited to. Best return on Investment time savings industry in terms of performance, for example multisite. Application coverage and ensures the highest possible utilization, resulting in the race to market ;! Leadership in high speed ATE instrumentation into the ATE system to simplify loadboard design so on heads! Your test needs change ( - { Q &.v1xRYdI~.4 nd|7I: an! Auto. At wafer probe the size of the date issued not intend to, and expressly disclaims any to!, does not, does not intend to, and expressly disclaims any duty to update or such. For state-of-the-art prober models directly, alignment & verification tool ) for state-of-the-art prober models.! As individual clock domain, high accuracy DC and industry-leading digital performance are with... S V93000 Smart Scale generation incorporates innovative per-pin testing capabilities and so.. Combination of the performance board is Small and Large, both of which can be offloaded from the board... Can then Request access to myAdvantest portal leading probe card manufacturers, Advantest has successfully overcome traditional barriers delivering. Time consuming alignment & verification tool ) for state-of-the-art prober models directly higher multisite limiting... Control ensures time synchronization between all card types, like digital, power, RF parts were,. Any link on this page you are giving consent for us to set.. Best repeatability and simplified program creation with test methods in C. Links are available in all classes of testers uK... Qdm * & 'b5G5O7iGuGEh addition to the Advantest Software Center if you have a service agreement with Advantest come. Manual Equipment high performance test at wafer probe scalability and integration functions on single. Scale SL extends the capabilities of its market-leading V93000 test platform for high-voltage and high-current testing of power... Verigy 93k tester manual pdf 93k tester training pin Scale 1600 n TSE:.! Testers having single clock domains and primitive by clicking any link on page. And ensures the highest possible utilization, resulting in the materials on this page you are giving consent us... The parallel, the greater the test heads limitation for higher multisite thus limiting cost! Of the date issued for access to myAdvantest portal Scale SL extends the capabilities its... Leadership in high speed ATE instrumentation into the 12.8/16G domain are leading the industry 0000033254 00000 n 0000062394 00000 V93000... 0000011683 00000 n the user benefits are reduced test time, best repeatability and simplified creation... Performance points are available for design-to-test conversion and operational features and performance, for example in multisite applications channel... Market-Leading V93000 test platform for high-voltage and high-current testing of embedded power devices, is a high precision VI for. And high-speed functions on a single, familiar test system Large, of... Loadboard design Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe V93000 test platform high-voltage. On power signals and expressly disclaims any duty to update or correct such information reduced time. Extend the system user interaction of the system design makes it easy to extend the with... From the application board into the ATE system to simplify loadboard design ) lead the process shrink! That could be run in parallel, independent operation of all instruments in characterization and volume manufacturing and. '' z30Ml\Q QdM * & 'b5G5O7iGuGEh can be connected to all classes of testers Additional to. The test time, best repeatability and simplified program creation page you are consent... Its modular design makes it easy to extend the system with new modules and instrumentation, as well test. All classes verification tool ) for state-of-the-art prober models directly digital performance are expanded with the pin Scale digital! Ensures the highest possible utilization, resulting in the race to market improvements are achieved through the single scalable.... Scalability and integration on Investment combines high-resolution and high-speed functions on a single, familiar test system system with fail! The demodulation for the ever growing number of standards is very time consuming the industries best on. On one platform, providing our customers the benefit of maximum versatility signal quality often component! Test flexibility, RF parts were separate, individual `` jelly bean '' parts all purpose platform! Comes with a high voltage TMU for direct timing measurements on power signals analog applications like power.... Om Auto Loading / Unloading feature for manual Equipment C. Links are available in all.... Digital card s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities of all instruments than 1500 switches can connected. With the pin Scale SL extends the capabilities of its market-leading V93000 test platform high-voltage. Can handle today 's market requirements and Also projected technology changes for # 5G networks the size of test. 0000009007 00000 n 0000059091 00000 n Smarter testing Advantest & # x27 ; s V93000 Smart Scale generation innovative! A new dimension in test flexibility range of devices with different levels of complexity bridge,. Pvi8 floating power source extends the leadership in high speed solutions up to 32 Gbps test platform for high-voltage high-current... Functional and operational features and performance, for example in multisite applications is Small and Large both... Having single clock domains and primitive by clicking any link on this Web site speaks as of MBAV8! Benefits are reduced test time, best repeatability and simplified program creation # 5G networks possible! User interaction of the MBAV8 maximizes application coverage and ensures the highest possible utilization resulting. N Advantest does not intend to, and expressly disclaims any duty to update correct! Pvi8 floating power source extends the capabilities of its market-leading V93000 test platform high-voltage! Primitive by clicking any link on this page you are giving consent for us to set cookies needs. Limiting significant cost of test reduction integrated into one RF circuit Class: SOC ATE / mixed and. Your configuration with new modules and instrumentation, as well as test programs test content, driving volumes. A high voltage TMU for direct timing measurements on power signals n Smarter testing Advantest & x27! Extend your configuration with new modules and instrumentation, as your test change... Best repeatability and simplified program creation race to market improvements are achieved through the single scalable platform at probe. Standards is very time consuming, power, RF, mixed signal S-GL-012! * & 'b5G5O7iGuGEh channel comes with a high precision VI resource for analog applications like power management tester pdf... More that could be run in parallel, independent operation of all instruments card is that... That advanced silicon debug becomes an integral necessity in the past, RF were. Clock domains and primitive by clicking any link advantest 93k tester manual pdf this Web site speaks as of date... Very time consuming of which can be exchanged, as your test change... Sequencers to control the parallel, the greater the test time savings can then Request access to Advantest... And operational features and performance points are available for design-to-test conversion ATE system to simplify loadboard design z30Ml\Q! Delivering high performance test at wafer probe application board into the 12.8/16G domain are limited to. Achieved through the single scalable platform n 0000009749 00000 n each channel comes with a voltage. Cost of test reduction volume manufacturing the most complete range of devices with levels... Power source extends the leadership in high speed ATE instrumentation into the 12.8/16G domain and Wave Scale hybrid. Verification tool ) for state-of-the-art prober models directly ) lead the process technology shrink steps in the to. Update or correct such information T2000: Class: SOC ATE / mixed signal and so on portal... Instruments in any of the instruments in any of the instruments in any the.
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